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Journal of Ceramic Science and Technology

The Journal of Ceramic Science and Technology publishes original scientific articles on all topics of ceramic science and technology from all ceramic branches. The focus is on the scientific exploration of  the relationships between processing, microstructure and properties of sintered ceramic materials as well as on new processing routes for innovative ceramic materials. The papers may have either theoretical or experimental background. A high quality of publications will be guaranteed by a thorough double blind peer review process.

The Journal is published by Göller Verlag GmbH on behalf of the Deutsche Keramische Gesellschaft (DKG). Edited by Yu-Ping Zeng, Shanghai Institute of Ceramics, Chinese Academy of Sciences, China.

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Articles

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High Permittivity and Dielectric Response of CaCu3Ti3.9(Y0.5Nb0.5)0.1O12 Ceramics

Y. Liu, X. Huang

School of Civil Engineering, Shaoguan University, Shaoguan 512005, China

received November 19, 2016, received in revised form January 9, 2017, accepted March 1, 2017

Vol. 8, No. 2, Pages 243-248   DOI: 10.4416/JCST2016-00112

Abstract

CaCu3Ti3.9(Y0.5Nb0.5)0.1O12 (CCTYNO) ceramics were prepared with the conventional solid-state method. Dielectric properties and electric responses at temperatures from - 80 to 200 °C were investigated in the frequency range of 100 – 1 MHz. A body-centered cubic structure was confirmed by means of X-ray diffraction. High dielectric permittivity (∼ 6000) and low dielectric loss (∼ 0.082) were observed at room temperature. Impedance spectroscopy measurements showed the resistance of the grain boundaries is higher by 2 – 3 orders of magnitude than that of the grains, indicating the different microstructure and electric property. The activation energy for the dc conduction process (0.593 eV) is comparable to that for the relaxation process (0.662 eV), implying that strong interfacial polarization at insulating grain boundaries may be responsible for the dielectric response of CCTYNO ceramic. Polyvalent cations (i.e. Cu+, Cu2+, Ti3+ and Ti4+) may cause changes in the conduction of semiconducting grains at high temperature.

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Keywords

Dielectric properties, impedance, co-doping, grain boundary, interfacial polarization

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