Our website is currently undergoing maintenance. Article records and full texts remain available. Submissions can be made through the Editorial Manager.

Effects of Annealing Temperature on Infrared Spectra of SiO₂ Extracted From Rice Husk

M. H. Shahrokh Abadi, A. Delbari, Z. Fakoor, J. Baedi

Journal of Ceramic Science and Technology, Vol. 6, No. 1 (2015), pp. 41-46

DOI: 10.4416/JCST2014-00028

Download full article (PDF)

Abstract

The effects of the annealing temperature on the structures and quantities of silicon dioxide obtained from rice husk by means of thermal treatment followed by acid leaching were studied with infrared transmission in the wavenumber range 400 – 4000 cm-1. The Fourier Transform Infrared Radiometer (FTIR) spectra of five series of samples including rice husk, rice husk ash burnt at 800 °C, and rice husk ash annealed at 900, 1000, and 1100 °C were analyzed and compared. It was demonstrated that the main absorption Si-O-Si bending band shifts towards lower wavenumbers while the peaks of stretching and rocking bands of Si-O-Si monotonically shift toward higher wavenumbers as the annealing temperature is increased. Analysis of the transmission samples showed that the shape of Si-O-Si bonds changes owing to the annealing temperature, varying in the range of 8 to 40 cm-1.

Keywords

FTIR, transmittance, SiO2, rice husk, bond structure, stretching, bending, rocking.

View this issue · Article & DOI index