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Effects of B2O3-V2O5 on Sinterability and Microwave Dielectric Properties of (Mg1-xCux)2SiO4 Ceramics
Chengxi Hu, Xiechao Hu, Ze Qing Guo, Amanda Ekeminiabasi Williams
Xihang university, Xi'an, Shaanxi CHINA
received June 3, 2025, received in revised form October 15, 2025, accepted October 16, 2025
Vol. 17, No. 1, Pages 101-106 DOI: 10.4416/JCST2025-00018
Abstract
The crystal structure, microstructure, and microwave dielectric properties of B2O3-V2O5 co-doped (Mg1-xCux)2SiO4 (x=0.05 – 0.20) ceramics were investigated. The sintering temperature was successfully reduced to about 1 250 °C/4 h for the B2O3-V2O5 co-doped (Mg1-xCux)2SiO4 specimens. The (Mg0.95Cu0.05)2SiO4 with 6 wt% B2O3 – 6 wt% V2O5 ceramics sintered at 1 250 °C for 4 h achieved excellent microwave dielectric properties of εr = 6.55, Q·ƒ = 37 500 GHz and a τƒ of - 35.65 ppm/K.
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Keywords
Microwave dielectric properties, B2O3-V2O5 co-doped, (Mg0.95Cu0.05)2SiO4, microwave ceramics
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